Search results for "Focus stacking"

showing 2 items of 2 documents

Visual Search Performance Depending on Target-Distractor Difference on Volumetric Display and Flat Panel Display

2019

The search items were demonstrated on the volumetric display and flat panel display. In contrast to the correct response rate, the search time and number of interactions were considerably affected by the type of visualization.

Visual searchVisual acuityComputer sciencebusiness.industrymedia_common.quotation_subject02 engineering and technologyVolumetric display021001 nanoscience & nanotechnologyCorrect response01 natural sciencesFlat panel displaylaw.inventionVisualizationFocus stacking010309 opticslaw0103 physical sciencesmedicineContrast (vision)Computer visionArtificial intelligencemedicine.symptom0210 nano-technologybusinessmedia_commonFrontiers in Optics + Laser Science APS/DLS
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Pattern image enhancement by extended depth of field

2014

Abstract Most optical defect localization techniques such as dynamic laser stimulation or photon emission microscopy require a pattern image of the device to be taken. The main purpose is for device navigation, but it also enables the analyst to identify the location of the monitored activity by superimposing it onto the pattern image. The defect localization workflow usually starts at low or medium magnification. At these scales, several factors can lead to a lack of orthogonality of the sample with the optical axis of the system. Therefore, images can be locally out of focus and poorly resolved. In this paper, a method based on Depth of Field Extension is suggested to correct the pattern …

business.industryMagnificationImage processingCondensed Matter PhysicsLaserAtomic and Molecular Physics and OpticsSurfaces Coatings and FilmsElectronic Optical and Magnetic Materialslaw.inventionFocus stackingOptical axisOpticslawComputer visionDepth of fieldArtificial intelligenceElectrical and Electronic EngineeringSafety Risk Reliability and QualitybusinessFocus (optics)Infrared microscopyMathematicsMicroelectronics Reliability
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